All types of electron microscope can now be used to deduce the local chemical composition of the specimen. The most recent development in this field is the extension of analysis in the transmission microscope (TEM) to the very light elements (boron, carbon, nitrogen, oxygen and fluorine). There are two major techniques by which this analysis can be performed: X-ray analysis without a window (WEDX) and electron energy loss spectroscopy (EELS). This book explains how both of these techniques work and how they should be used. The emphasis is on practical aspects of collecting and interpreting spectra rather than on the fundamental physical background. Each technique is described first as it is used for qualitative analysis and then quantitative analysis is developed. In a final chapter the two techniques are compared.
Product Identifiers
Publisher
Bios Scientific Publishers LTD
ISBN-13
9780198564171
eBay Product ID (ePID)
87166938
Product Key Features
Author
P.M. Budd, P. J. Goodhew
Publication Name
Light-Element Analysis in the Transmission Electron Microscope: Wedx and Eels