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About this product
- DescriptionA thorough review of the properties of deep-level, localized defects in semiconductors.
- Author(s)David Redfield,Richard H. Bube
- PublisherCambridge University Press
- Date of Publication26/01/1996
- Series TitleCambridge Studies in Semiconductor Physics & Microelectronic Engineering
- Series Part/Volume NumberNo. 4
- Place of PublicationCambridge
- Country of PublicationUnited Kingdom
- ImprintCambridge University Press
- Content Note106 b/w illus.
- Weight510 g
- Width152 mm
- Height228 mm
- Spine17 mm
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