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Defects in HIgh-k Gate Dielectric Stacks: Nano-Electronic Semiconductor Devices by Evgeni Gusev (Paperback, 2006)

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Author: Evgeni Gusev ISBN 10: 140204366X. Title: Defects in HIgh-k Gate Dielectric Stacks: Nano-Electronic Semico Item Condition: New. New: New books are in mint condition, normally sourced directly from publishers.