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About this product
- DescriptionThis book covers a broad range of topics related to SRAM design and testing. It includes everything from SRAM operation basics through cell electrical and physical design to process-aware and economical approach to SRAM testing.
- Author BiographyProf. Sachdev has authored several successful books with Springer
- Author(s)Andrei Pavlov,Manoj Sachdev
- PublisherSpringer-Verlag New York Inc.
- Date of Publication01/05/2008
- GenreElectronics Engineering & Communications Engineering
- Series TitleFrontiers in Electronic Testing
- Series Part/Volume Numberv. 40
- Place of PublicationNew York, NY
- Country of PublicationUnited States
- ImprintSpringer-Verlag New York Inc.
- Content Notebiography
- Weight1050 g
- Width156 mm
- Height234 mm
- Spine12 mm
- Format DetailsLaminated cover
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