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About this product
- DescriptionFrom materials science to integrated circuit development, technology is moving from the microscale toward the nanoscale. This book reviews the fundamental physics underlying techniques for analyzing the surfaces and near-surfaces.
- Author(s)James W. Mayer,L.C. Feldman,Terry L. Alford
- PublisherSpringer-Verlag New York Inc.
- Date of Publication16/02/2007
- GenreTechnology: General & Reference
- Place of PublicationNew York, NY
- Country of PublicationUnited States
- ImprintSpringer-Verlag New York Inc.
- Content NoteXIV, 336 p.
- Weight1490 g
- Width156 mm
- Height235 mm
- Edition Statement2007 ed.
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