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About this product
- DescriptionThis book provides an overview of automatic test pattern generation (ATPG) and introduces novel techniques to complement classical ATPG, based on Boolean Satisfiability (SAT). It presents a fast and highly fault efficient SAT-based ATPG framework.
- Author(s)Rolf Drechsler,Stephan Eggersgluess
- PublisherSpringer-Verlag New York Inc.
- Date of Publication10/03/2011
- GenreElectronics Engineering & Communications Engineering
- Place of PublicationNew York, NY
- Country of PublicationUnited States
- ImprintSpringer-Verlag New York Inc.
- Content Note52 black & white tables, biography
- Weight476 g
- Width156 mm
- Height234 mm
- Spine12 mm
- Format DetailsLaminated cover
- Edition Statement2012
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