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Debugging at the Electronic System Level by Rogin & Drechsler 2010 Hardcover
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Located in: Clarence, New York, United States
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eBay item number:125391081107
Item specifics
- Condition
- ISBN
- 9789048192540
About this product
Product Identifiers
Publisher
Springer Netherlands
ISBN-10
9048192544
ISBN-13
9789048192540
eBay Product ID (ePID)
102824001
Product Key Features
Number of Pages
Xix, 199 Pages
Publication Name
Debugging at the Electronic System Level
Language
English
Publication Year
2010
Subject
Software Development & Engineering / Quality Assurance & Testing, Systems Architecture / General, Electronics / Circuits / Integrated, Electronics / Circuits / General, Software Development & Engineering / Systems Analysis & Design
Type
Textbook
Subject Area
Computers, Technology & Engineering
Format
Hardcover
Dimensions
Item Weight
38.1 Oz
Item Length
9.3 in
Item Width
6.1 in
Additional Product Features
Intended Audience
Scholarly & Professional
LCCN
2010-929863
Dewey Edition
23
Number of Volumes
1 vol.
Illustrated
Yes
Dewey Decimal
621.392
Table Of Content
List of Figures. List of Tables. Preface. Acknowledgements.1. INTRODUCTION. 2. ESL DESIGN AND VERIFICATION. 3. EARLY ERROR DETECTION. 4. HIGH-LEVEL DEBUGGING AND EXPLORATION. 5. LEARNING ABOUT THE DESIGN. 6. ISOLATING FAILURE CAUSES. 7. SUMMARY AND CONCLUSION. Appendix A. FDC Language. Appendix B. Debug Pattern Catalog.- References. List of Acronyms. Index of Symbols. Index.
Synopsis
Debugging is the bottleneck to chip design productivity. This state-of-the-art book reviews modeling and verification of ESL designs. It is believed to be the first book that considers debugging for ESL designs. There is particular focus on SystemC., List of Figures. List of Tables. Preface. Acknowledgements. 1. INTRODUCTION; 1 General Objective of the Book; 2 Summary of Contributions; 3 Book Outline. 2. ESL DESIGN AND VERIFICATION; 1 ESL Design; 2 ESL Verification; 3 Our Debugging Approach. 3. EARLY ERROR DETECTION; 1 Deduction Techniques in a Nutshell; 2 Static Analysis Framework; 3 SystemC Design Analysis System; 4 Experimental Results; 5 Summary and Future Work. 4. HIGH-LEVEL DEBUGGING AND EXPLORATION; 1 Observation Techniques in a Nutshell; 2 System-Level Debugging; 3 High-Level SystemC Debugging; 4 Experimental Results; 5 Summary and Future Work. 5. LEARNING ABOUT THE DESIGN; 1 Induction Techniques in a Nutshell; 2 Automatic Generation of Properties; 3 Dynamic Invariant Analysis on Simulation Traces; 4 Experimental Results; 5 Summary and Future Work. 6. ISOLATING FAILURE CAUSES; 1 Experimentation Techniques in a Nutshell; 2 Automatic Isolation of Failure Causes; 3 Automatic Isolation of Failure Causes in SystemC; 4 Experimental Results; 5 Summary and Future Work. 7. SUMMARY AND CONCLUSION. Appendix A. FDC Language; 1 FDC Syntax; 2 FDC Semantic. Appendix B. Debug Pattern Catalog; 1 General Format; 2 COMPETITION Pattern; 3 TIMELOCK Pattern. References. List of Acronyms. Index of Symbols. Index., Debugging becomes more and more the bottleneck to chip design productivity, especially while developing modern complex integrated circuits and systems at the Electronic System Level (ESL). Today, debugging is still an unsystematic and lengthy process. Here, a simple reporting of a failure is not enough, anymore. Rather, it becomes more and more important not only to find many errors early during development but also to provide efficient methods for their isolation. In Debugging at the Electronic System Level the state-of-the-art of modeling and verification of ESL designs is reviewed. There, a particular focus is taken onto SystemC. Then, a reasoning hierarchy is introduced. The hierarchy combines well-known debugging techniques with whole new techniques to improve the verification efficiency at ESL. The proposed systematic debugging approach is supported amongst others by static code analysis, debug patterns, dynamic program slicing, design visualization, property generation, and automatic failure isolation. All techniques were empirically evaluated using real-world industrial designs. Summarized, the introduced approach enables a systematic search for errors in ESL designs. Here, the debugging techniques improve and accelerate error detection, observation, and isolation as well as design understanding.
LC Classification Number
TK7867-7867.5
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