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Scanning Electron Microscopy And X-Ray Microanalysis von Joseph Goldstein (2017, Gebundene Ausgabe)

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Titel: Scanning Electron Microscopy and X-Ray Microanalysis, Einband: Buch, Autor: Joseph Goldstein, Verlag: Springer-Verlag Gmbh, Sprache: Englisch, Seiten: 550, Maße: 285x215x35 mm, Gewicht: 1808 g, Verkäufer: buchrakete, Schlagworte: Mikroskopie Spektroskopie Arbeitsstoff Material Werkstoff Biowissenschaften Life Sciences TECHNOLOGY & ENGINEERING / Materials Science EBSD Electron backscatter diffraction Environmental SEM Focused ion beam Ion beam microanalysis Qualitative X-ray analysis Quantitative X-ray analysis SDD x-ray detectors SEM textbook Table top SEM Variable pressure SEM X-ray mapping X-ray microanalysis book X-ray spectral measurement dual column instruments.