Failure Mechanisms in Semiconductor Devices by Farid N. Najm and E. Ajith Amerasekera (1997, Hardcover)

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The references have been updated and recent advances are discussed. Failure Analysis. Language English. Publication Date 1997-06-20. Publisher John Wiley & Sons Inc. Author Farid N. Najm. US Release Date 1997-06-20.

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Product Identifiers

PublisherWiley & Sons, Incorporated, John
ISBN-100471954829
ISBN-139780471954828
eBay Product ID (ePID)86625766

Product Key Features

Number of Pages360 Pages
LanguageEnglish
Publication NameFailure Mechanisms in Semiconductor Devices
Publication Year1997
SubjectElectronics / Semiconductors
FeaturesRevised
TypeTextbook
AuthorFarid N. Najm, E. Ajith Amerasekera
Subject AreaTechnology & Engineering
FormatHardcover

Dimensions

Item Height1 in
Item Weight24.1 oz.
Item Length9.2 in
Item Width6.1 in

Additional Product Features

Edition Number2
Intended AudienceScholarly & Professional

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