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Electromigration Inside Logic Cells : Modeling, Analyzing and Mitigating Signal Electromigration in NanoCMOS by Gracieli Posser, Ricardo Reis and Sachin S. Sapatnekar (2016, Hardcover)
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ISBN-13: 9783319488981, 978-3319488981. The authors are the first to analyze and propose a solution for the electromigration effects inside logic cells of a circuit. Electromigration Inside Logic Cells.
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About this product
Product Identifiers
PublisherSpringer International Publishing A&G
ISBN-103319488988
ISBN-139783319488981
eBay Product ID (ePID)22046553780
Product Key Features
Book TitleElectromigration Inside Logic Cells : Modeling, Analyzing and Mitigating Signal Electromigration in NanoCMOS
Number of PagesXx, 118 Pages
LanguageEnglish
Publication Year2016
TopicSystems Architecture / General, Electronics / Semiconductors, Electronics / Circuits / General, Electronics / General
IllustratorYes
GenreComputers, Technology & Engineering
AuthorGracieli Posser, Ricardo Reis, Sachin S. Sapatnekar
FormatHardcover
Dimensions
Item Weight119.1 oz.
Item Length9.3 in
Item Width6.1 in
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