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Applied Scanning Probe Methods III: Characterizati
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- Buy it nowApplied Scanning Probe Methods III: Characterization by Bharat Bhushan: New
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eBay item number:285035202664
Item specifics
- Condition
- Book Title
- Applied Scanning Probe Methods III: Characterization
- Publication Date
- 2006-02-22
- Pages
- 378
- ISBN
- 9783540269090
About this product
Product Identifiers
Publisher
Springer Berlin / Heidelberg
ISBN-10
3540269096
ISBN-13
9783540269090
eBay Product ID (ePID)
48251582
Product Key Features
Number of Pages
Xliv, 378 Pages
Publication Name
Applied Scanning Probe Methods III : Characterization
Language
English
Subject
Spectroscopy & Spectrum Analysis, Electron Microscopes & Microscopy, Chemistry / Physical & Theoretical, Nanotechnology & Mems, Microscopes & Microscopy
Publication Year
2006
Type
Textbook
Subject Area
Technology & Engineering, Science
Series
Nanoscience and Technology Ser.
Format
Hardcover
Dimensions
Item Height
0.3 in
Item Weight
28.2 Oz
Item Length
9.3 in
Item Width
6.1 in
Additional Product Features
Intended Audience
Scholarly & Professional
LCCN
2003-059049
Reviews
From the reviews: "The editors have done a good job in making the various chapters quite readable and most of the chapters are well written on a level that will be accessible to most readers. ... As is usually the case with Springer books, these volumes have been beautifully printed, illustrated, and nicely bound for long term durability." (Gary J. Long & Fernande Grandjean, Physicalia Magazine, Vol. 29 (4), 2007, From the reviews:"The editors have done a good job in making the various chapters quite readable and most of the chapters are well written on a level that will be accessible to most readers. … As is usually the case with Springer books, these volumes have been beautifully printed, illustrated, and nicely bound for long term durability." (Gary J. Long & Fernande Grandjean, Physicalia Magazine, Vol. 29 (4), 2007
Dewey Edition
22
Number of Volumes
1 vol.
Illustrated
Yes
Dewey Decimal
502.82
Table Of Content
Atomic Force Microscopy in Nanomedicine.- Scanning Probe Microscopy: From Living Cells to the Subatomic Range.- Surface Characterization and Adhesion and Friction Properties of Hydrophobic Leaf Surfaces and Nanopatterned Polymers for Superhydrophobic Surfaces.- Probing Macromolecular Dynamics and the Influence of Finite Size Effects.- Investigation of Organic Supramolecules by Scanning Probe Microscopy in Ultra-High Vacuum.- One- and Two-Dimensional Systems: Scanning Tunneling Microscopy and Spectroscopy of Organic and Inorganic Structures.- Scanning Probe Microscopy Applied to Ferroelectric Materials.- Morphological and Tribological Characterization of Rough Surfaces by Atomic Force Microscopy.- AFM Applications for Contact and Wear Simulation.- AFM Applications for Analysis of Fullerene-Like Nanoparticles.- Scanning Probe Methods in the Magnetic Tape Industry.
Synopsis
The Nobel Prize of 1986 on Sc- ning Tunneling Microscopy sig- led a new era in imaging. The sc- ning probes emerged as a new i- trument for imaging with a pre- sion suf'cient to delineate single atoms. At ?rst there were two - the Scanning Tunneling Microscope, or STM, and the Atomic Force Mic- scope, or AFM. The STM relies on electrons tunneling between tip and sample whereas the AFM depends on the force acting on the tip when it was placed near the sample. These were quickly followed by the - gneticForceMicroscope, MFM, and the Electrostatic Force Microscope, EFM. The MFM will image a single magnetic bit with features as small as 10nm. With the EFM one can monitor the charge of a single electron. Prof. Paul Hansma at Santa Barbara opened the door even wider when he was able to image biological objects in aqueous environments. At this point the sluice gates were opened and a multitude of different instruments appeared. There are signi'cant differences between the Scanning Probe Microscopes or SPM, and others such as the Scanning Electron Microscope or SEM. The probe microscopes do not require preparation of the sample and they operate in ambient atmosphere, whereas, the SEM must operate in a vacuum environment and the sample must be cross-sectioned to expose the proper surface. However, the SEM can record 3D image and movies, features that are not available with the scanning probes., The Nobel Prize of 1986 on Sc- ning Tunneling Microscopy sig- led a new era in imaging. The sc- ning probes emerged as a new i- trument for imaging with a pre- sion suf'cient to delineate single atoms. At ?rst there were two - the Scanning Tunneling Microscope, or STM, and the Atomic Force Mic- scope, or AFM. The STM relies on electrons tunneling between tip and sample whereas the AFM depends on the force acting on the tip when it was placed near the sample. These were quickly followed by the - gneticForceMicroscope,MFM,and the Electrostatic Force Microscope, EFM. The MFM will image a single magnetic bit with features as small as 10nm. With the EFM one can monitor the charge of a single electron. Prof. Paul Hansma at Santa Barbara opened the door even wider when he was able to image biological objects in aqueous environments. At this point the sluice gates were opened and a multitude of different instruments appeared. There are signi'cant differences between the Scanning Probe Microscopes or SPM, and others such as the Scanning Electron Microscope or SEM. The probe microscopes do not require preparation of the sample and they operate in ambient atmosphere, whereas, the SEM must operate in a vacuum environment and the sample must be cross-sectioned to expose the proper surface. However, the SEM can record 3D image and movies, features that are not available with the scanning probes., Volumes II, III and IV examine the physical and technical foundation for recent progress in applied near-field scanning probe techniques, and build upon the first volume published in early 2004. The field is progressing so fast that there is a need for a second set of volumes to capture the latest developments. It constitutes a timely comprehensive overview of SPM applications, now that industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. Volume II introduces scanning probe microscopy, including sensor technology, Volume III covers the whole range of characterization possibilities using SPM and Volume IV offers chapters on uses in various industrial applications. The international perspective offered in these three volumes - which belong together - contributes further to the evolution of SPM techniques.
LC Classification Number
TK7875
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- m***m (2282)- Feedback left by buyer.Past 6 monthsVerified purchaseI’m thrilled with my recent purchase . The website was user-friendly, and the product descriptions were accurate. Customer service was prompt and helpful, answering all my questions. My order arrived quickly, well-packaged, and the product exceeded my expectations in quality. I’m impressed with the attention to detail and the overall experience. I’ll definitely shop here again and highly recommend from this seller to others. Thank you for a fantastic experience!
- a***n (43)- Feedback left by buyer.Past 6 monthsVerified purchaseMistakenly ordered a paperback that I thought was a hardcover, not sellers fault; it was described properly on the listing. Seller still processed a refund the day I went to return the item and let me keep the item anyway. A+++ service. Book arrived quickly in great condition and for a great price. Thank you so much! Amazing seller!
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- m***m (2282)- Feedback left by buyer.Past 6 monthsVerified purchaseI’m thrilled with my recent purchase . The website was user-friendly, and the product descriptions were accurate. Customer service was prompt and helpful, answering all my questions. My order arrived quickly, well-packaged, and the product exceeded my expectations in quality. I’m impressed with the attention to detail and the overall experience. I’ll definitely shop here again and highly recommend from this seller to others. Thank you for a fantastic experience!
- a***n (43)- Feedback left by buyer.Past 6 monthsVerified purchaseMistakenly ordered a paperback that I thought was a hardcover, not sellers fault; it was described properly on the listing. Seller still processed a refund the day I went to return the item and let me keep the item anyway. A+++ service. Book arrived quickly in great condition and for a great price. Thank you so much! Amazing seller!
- n***c (94)- Feedback left by buyer.Past 6 monthsVerified purchaseseller was communicative about my shipment, media mail took a while and tracking wasn't updated frequently, but seller communicated to me very quickly on status. the item came new and wrapped as described, though the packaging in it was packed wasn't sturdy and falling apart when it got to me.