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EMF: Eclipse Modeling Framework, Merks, Ed

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Last updated on 07 Jun, 2025 15:03:49 BSTView all revisionsView all revisions

Item specifics

Condition
Very Good: A book that has been read and does not look new, but is in excellent condition. No ...
Title
EMF: Eclipse Modeling Framework
Book Title
EMF: Eclipse Modeling Framework
Contributor
By (author) Frank Budinsky
ISBN
0321331885
EAN
9780321331885
Binding
Paperback
Genre
Digital lifestyle
Height
43.18
Length
223.52
Width
175.26
Release Title
EMF: Eclipse Modeling Framework
Artist
Merks, Ed
Brand
N/A
Colour
N/A
Publication Year
2008
Type
Textbook
Format
Paperback
Language
English
Publication Name
Emf: Eclipse Modeling Framework
Item Height
231 mm
Author
Ed Merks, Marcelo Paternostro, Dave Steinberg, Frank Budinsky
Publisher
Pearson Education (Us)
Subject
Computer Science
Item Weight
1180 g
Item Width
181 mm
Number of Pages
744 Pages

About this product

Product Information

EMF: Eclipse Modeling Framework Dave Steinberg Frank Budinsky Marcelo Paternostro Ed Merks Series Editors: Erich Gamma * Lee Nackman * John Wiegand The Authoritative Guide to EMF Modeling and Code Generation The Eclipse Modeling Framework enables developers to rapidly construct robust applications based on surprisingly simple models. Now, in this thoroughly revised Second Edition, the project's developers offer expert guidance, insight, and examples for solving real-world problems with EMF, accelerating development processes, and improving software quality. This edition contains more than 40% new material, plus updates throughout to make it even more useful and practical. The authors illuminate the key concepts and techniques of EMF modeling, analyze EMF's most important framework classes and generator patterns, guide you through choosing optimal designs, and introduce powerful framework customizations and programming techniques. Coverage includes * Defining models with Java, UML, XML Schema, and Ecore * NEW: Using extended Ecore modeling to fully unify XML with UML and Java * Generating high-quality code to implement models and editors * Understanding and customizing generated code * Complete documentation of @model Javadoc tags, generator model properties, and resource save and load options * NEW: Leveraging the latest EMF features, including extended metadata, feature maps, EStore, cross-reference adapters, copiers, and content types * NEW: Chapters on change recording, validation, and utilizing EMF in stand-alone and Eclipse RCP applications * NEW: Modeling generics with Ecore and generating Java 5 code About the Authors Dave Steinberg is a software developer in IBM Software Group. He has worked with Eclipse and modeling technologies since joining the company, and has been a committer on the EMF project since its debut in 2002. Frank Budinsky, a senior architect in IBM Software Group, is an original coinventor of EMF and a founding member of the EMF project at Eclipse. He is currently cochair of the Service Data Objects (SDO) specification technical committee at OASIS and lead SDO architect for IBM. Marcelo Paternostro is a software architect and engineer in IBM Software Group. He is an EMF committer and has been an active contributor to several other Eclipse projects. Before joining IBM, Marcelo managed, designed, and implemented numerous projects using Rational's tools and processes. Ed Merks is the project lead of EMF and a colead of the top-level Modeling project at Eclipse. He holds a Ph.D. in Computing Science and has many years of in-depth experience in the design and implementation of languages, frameworks, and application development environments. Ed works as a software consultant in partnership with itemis AG.

Product Identifiers

Publisher
Pearson Education (Us)
ISBN-13
9780321331885
eBay Product ID (ePID)
88416712

Product Key Features

Number of Pages
744 Pages
Publication Name
Emf: Eclipse Modeling Framework
Language
English
Subject
Computer Science
Publication Year
2008
Type
Textbook
Author
Ed Merks, Marcelo Paternostro, Dave Steinberg, Frank Budinsky
Format
Paperback

Dimensions

Item Height
231 mm
Item Weight
1180 g
Item Width
181 mm

Additional Product Features

Country/Region of Manufacture
United States
Title_Author
Ed Merks, Marcelo Paternostro, Frank Budinsky, Dave Steinberg

Item description from the seller

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VAT number: DE 281042328, EL 996857788, ES N8267548I, FR 27823676960, GB 922696893, IT 00185819992
CRN: 06437594
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