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Testing of Digital Systems by Gupta, S. Hardback Book The Fast Free Shipping

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Item specifics

Condition
Very Good: A book that has been read and does not look new, but is in excellent condition. No ...
ISBN
0521773563
EAN
9780521773560
Release Title
Testing of Digital Systems
Artist
Gupta, S.
Brand
N/A
Colour
N/A
Book Title
Testing of Digital Systems
Subject Area
Computers
Publication Name
Testing of Digital Systems
Publisher
Cambridge University Press
Item Length
10.1 in
Subject
Computer Engineering
Publication Year
2003
Type
Textbook
Format
Hardcover
Language
English
Item Height
1.9 in
Author
Sandeep Gupta, Niraj Jha
Item Weight
77.1 Oz
Item Width
7.1 in
Number of Pages
1016 Pages

About this product

Product Information

Device testing represents the single largest manufacturing expense in the semiconductor industry, costing over $40 billion a year. The most comprehensive and wide ranging book of its kind, Testing of Digital Systems covers everything you need to know about this vitally important subject. Starting right from the basics, the authors take the reader through automatic test pattern generation, design for testability and built-in self-test of digital circuits before moving on to more advanced topics such as IDDQ testing, functional testing, delay fault testing, memory testing, and fault diagnosis. The book includes detailed treatment of the latest techniques including test generation for various fault models, discussion of testing techniques at different levels of integrated circuit hierarchy and a chapter on system-on-a-chip test synthesis. Written for students and engineers, it is both an excellent senior/graduate level textbook and a valuable reference.

Product Identifiers

Publisher
Cambridge University Press
ISBN-10
0521773563
ISBN-13
9780521773560
eBay Product ID (ePID)
1682845

Product Key Features

Number of Pages
1016 Pages
Language
English
Publication Name
Testing of Digital Systems
Publication Year
2003
Subject
Computer Engineering
Type
Textbook
Subject Area
Computers
Author
Sandeep Gupta, Niraj Jha
Format
Hardcover

Dimensions

Item Height
1.9 in
Item Weight
77.1 Oz
Item Length
10.1 in
Item Width
7.1 in

Additional Product Features

Intended Audience
Scholarly & Professional
LCCN
2003-277476
Dewey Edition
21
Illustrated
Yes
Dewey Decimal
621.381548
Lc Classification Number
Tk7874.65 .J43 2003
Table of Content
1. Introduction; 2. Fault models; 3. Combinational logic and fault simulation; 4. Test generation for combinational circuits; 5. Sequential ATPG; 6. IDDQ testing; 7. Functional testing; 8. Delay fault testing; 9. CMOS testing; 10. Fault diagnosis; 11. Design for testability; 12. Built-in self-test; 13. Synthesis for testability; 14. Memory testing; 15. High-level test synthesis; 16. System-on-a-chip testing; Index.
Copyright Date
2002

Item description from the seller

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