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Analog and Mixed-Signal Boundary-Scan: A Guide to the IEEE 1149.4 Test Standard
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eBay item number:395159187513
Item specifics
- Condition
- ISBN-13
- 9781441951151
- Book Title
- Analog and Mixed-Signal Boundary-Scan
- ISBN
- 9781441951151
- Publication Year
- 2010
- Series
- Frontiers in Electronic Testing Ser.
- Type
- Textbook
- Format
- Trade Paperback
- Language
- English
- Publication Name
- Analog and Mixed-Signal Boundary-Scan : a Guide to the IEEE 1149. 4 Test Standard
- Item Length
- 9.3in
- Publisher
- Springer
- Item Width
- 6.1in
- Item Weight
- 16 Oz
- Number of Pages
- Xviii, 156 Pages
About this product
Product Information
This book contains more than the IEEE Standard 1149.4. It also contains the thoughts of those who developed the standard. Adam Osseiran has edited the original writings of Brian Wilkins, Colin Maunder, Rod Tulloss, Steve Sunter, Mani Soma, Keith Lofstrom and John McDermid, all of whom have personally contributed to this standard. To preserve the original spirit, only minor changes were made, and the reader will sense a chapter-to-chapter variation in the style of expression. This may appear awkward to some, although I found the Iack of monotonicity refreshing. A system consists of a specific organization of parts. The function of the system cannot be performed by an individual part or even a disorganized collection ofthe same parts. Testing has a system-like characteristic. Testing of a system does not follow directly from the testing of its parts, and a system built with testable parts can sometimes be impossible to test. Therefore, testability of the system must be organized. Some years ago, the IEEE published the boundary-scan Standard 1149.1. That Standard provided an architecture for digital VLSI chips. The chips designed with the 1149.1 architecture can be integrated into a testable system. However, many systems today contain both analog and digital chips. Even if all digital chips are compliant with the standard, the testability of a mixed-signal system cannot be guaranteed. The new Standard 1149.4, described in this book, extends the previous architecture to mixed-signal systems.
Product Identifiers
Publisher
Springer
ISBN-10
1441951156
ISBN-13
9781441951151
eBay Product ID (ePID)
109185337
Product Key Features
Publication Name
Analog and Mixed-Signal Boundary-Scan : a Guide to the IEEE 1149. 4 Test Standard
Format
Trade Paperback
Language
English
Publication Year
2010
Series
Frontiers in Electronic Testing Ser.
Type
Textbook
Number of Pages
Xviii, 156 Pages
Dimensions
Item Length
9.3in
Item Width
6.1in
Item Weight
16 Oz
Additional Product Features
Series Volume Number
16
Number of Volumes
1 Vol.
Lc Classification Number
Tk7867-7867.5
Table of Content
1 Introduction to the IEEE 1149.4.- 2 The Boundary-Scan Standard.- 3 IEEE 1149.4 Architecture and Instruction Set.- 4 System Test Methodologies Using IEEE 1149.4.- 5 Peripheral Cell Design for IEEE 1149.4.- 6 Structural Testing.
Copyright Date
1999
Topic
Electronics / Circuits / Integrated, Electronics / Circuits / General, Electrical
Dewey Decimal
621.381548
Intended Audience
Scholarly & Professional
Dewey Edition
22
Illustrated
Yes
Genre
Technology & Engineering
Item description from the seller
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Premier Books LLC
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