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High Frequency Measurements and Noise in Electronic Circuits by Douglas C Smith

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Approximately£177.87
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eBay item number:403145682057
Last updated on 05 Dec, 2024 12:08:44 GMTView all revisionsView all revisions

Item specifics

Condition
New: A new, unread, unused book in perfect condition with no missing or damaged pages. See the ...
Publication Date
1992-12-31
Pages
232
ISBN
9780442006365

About this product

Product Identifiers

Publisher
Springer
ISBN-10
0442006365
ISBN-13
9780442006365
eBay Product ID (ePID)
919801

Product Key Features

Book Title
High Frequency Measurements and Noise in Electronic Circuits
Number of Pages
Xvi, 232 Pages
Language
English
Publication Year
1992
Topic
Signals & Signal Processing, Physics / Electromagnetism, Electronics / Circuits / General, Electrical
Illustrator
Yes
Genre
Technology & Engineering, Science
Author
Douglas C. Smith
Format
Hardcover

Dimensions

Item Weight
41.6 Oz
Item Length
9.2 in
Item Width
6.1 in

Additional Product Features

LCCN
92-004845
Dewey Edition
20
Number of Volumes
1 vol.
Dewey Decimal
621.381548
Synopsis
This ready reference provides electrical engineers with practical information on accurate methods for measuring signals and noise in electronic circuits as well as methods for locating and reducing high frequency noise generated by circuits or external interference. Engineers often find that measuring and mitigating high frequency noise signals in electronic circuits can be problematic when utilizing common measurement methods. Demonstrating the innovative solutions he developed as a Distinguished Member of Technical Staff at AT&T/Bell Laboratories, solutions which earned him numerous U.S. and foreign patents, Douglas Smith has written the most definitive work on this subject. Smith explains design problems related to the new high frequency electronic standards, and then systematically provides laboratory proven methods for making accurate noise measurements, while demonstrating how these results should be interpreted. The technical background needed to conduct these experiments is provided as an aid to the novice, and as a reference for the professional. Smith also discusses theoretical concepts as they relate to practical applications. Many of the techniques Smith details in this book have been previously unpublished, and have been proven to solve problems in hours rather than in the days or weeks of effort it would take conventional techniques to yield results. Comprehensive and informative, this volume provides detailed coverage of such areas as: scope probe impedance, grounding, and effective bandwidth, differential measurement techniques, noise source location and identification, current probe characteristics, operation, and applications, characteristics of sources of interference to measurements and the minimization of their effects, minimizing coupling of external noise into the equipment under test by measurements, estimating the effect of ameasurement on equipment operation, using digital scopes for single shot noise measurements, prediction of equipment electromagnetic interference (EMI) emission and susceptibility of performance, null experiments for validating measurement data, the relationship between high frequency noise and final product reliability. With governmental regulations and MIL standards now governing the emission of high frequency electronic noise and the susceptibility to pulsed EMI, the information presented in this guide is extremely pertinent. Electrical engineers will find High Frequency Measurements and Noise in Electronic Circuits an essential desktop reference for information and solutions, and engineering students will rely on it as a virtual source book for deciphering the "mysteries" unique to high frequency electronic circuits., This ready reference provides electrical engineers with practical information on accurate methods for measuring signals and noise in electronic circuits as well as methods for locating and reducing high frequency noise generated by circuits or external interference. Engineers often find that measuring and mitigating high frequency noise signals in electronic circuits can be problematic when utilizing common measurement methods. Demonstrating the innovative solutions he developed as a Distinguished Member of Technical Staff at AT&T/Bell Laboratories, solutions which earned him numerous U.S. and foreign patents, Douglas Smith has written the most definitive work on this subject. Smith explains design problems related to the new high frequency electronic standards, and then systematically provides laboratory proven methods for making accurate noise measurements, while demonstrating how these results should be interpreted. The technical background needed to conduct these experiments is provided as an aid to the novice, and as a reference for the professional. Smith also discusses theoretical concepts as they relate to practical applications. Many of the techniques Smith details in this book have been previously unpublished, and have been proven to solve problems in hours rather than in the days or weeks of effort it would take conventional techniques to yield results. Comprehensive and informative, this volume provides detailed coverage of such areas as: scope probe impedance, grounding, and effective bandwidth, differential measurement techniques, noise source location and identification, current probe characteristics, operation, and applications, characteristics of sources of interference to measurements and the minimization of their effects, minimizing coupling of external noise into the equipment under test by measurements, estimating the effect of a measurement on equipment operation, using digital scopes for single shot noise measurements, prediction of equipment electromagnetic interference (EMI) emission and susceptibility of performance, null experiments for validating measurement data, the relationship between high frequency noise and final product reliability. With governmental regulations and MIL standards now governing the emission of high frequency electronic noise and the susceptibility to pulsed EMI, the information presented in this guide is extremely pertinent. Electrical engineers will find High Frequency Measurements and Noise in Electronic Circuits an essential desktop reference for information and solutions, and engineering students will rely on it as a virtual source book for deciphering the "mysteries" unique to high frequency electronic circuits.
LC Classification Number
TK7867-7867.5

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