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Springerbriefs in Physics Ser.: Photo-Excited Charge Collection Spectroscopy : Probing the Traps in Field-Effect Transistors by Seongil Im, Youn-Gyoung Chang and Jae Hoon Kim (2013, Trade Paperback)

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ISBN-13: 9789400763913, 978-9400763913. Solid state field-effect devices such as organic and inorganic-channel thin-film transistors (TFTs) have been expected to promote advances in display and sensor electronics.

About this product

Product Identifiers

PublisherSpringer Netherlands

ISBN-109400763913

ISBN-139789400763913

eBay Product ID (ePID)141463880

Product Key Features

Number of PagesXi, 101 Pages

Publication NamePhoto-Excited Charge Collection Spectroscopy : Probing the Traps in Field-Effect Transistors

LanguageEnglish

SubjectPhysics / Condensed Matter, Physics / Optics & Light, Materials Science / Thin Films, Surfaces & Interfaces, Electronics / Circuits / General, Electronics / Transistors

Publication Year2013

TypeTextbook

Subject AreaTechnology & Engineering, Science

AuthorSeongil Im, Youn-Gyoung Chang, Jae Hoon Kim

SeriesSpringerbriefs in Physics Ser.

FormatTrade Paperback