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Semiconductor Laser Engineering, Reliability and Diagnostics : A Practical Approach to High Power and Single Mode Devices by Peter W. Epperlein (2013, Hardcover)
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Stability criteria of critical laser characteristics and key laser robustness factors are discussed along with clear design considerations in the context of reliability engineering approaches and models, and typical programs for reliability tests and laser product qualifications.
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About this product
Product Identifiers
PublisherWiley & Sons, Incorporated, John
ISBN-101119990335
ISBN-139781119990338
eBay Product ID (ePID)138574140
Product Key Features
Number of Pages520 Pages
LanguageEnglish
Publication NameSemiconductor Laser Engineering, Reliability and Diagnostics : A Practical Approach to High Power and Single Mode Devices
Publication Year2013
SubjectLasers & Photonics
TypeTextbook
AuthorPeter W. Epperlein
Subject AreaTechnology & Engineering
FormatHardcover
Dimensions
Item Height1.5 in
Item Weight27.3 oz.
Item Length9.3 in
Item Width6.3 in
Additional Product Features
Intended AudienceScholarly & Professional
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