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Scanning Probe Microscopy in Industrial Applications : Nanomechanical Characterization by Dalia G. Yablon (2013, Hardcover)
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ISBN-13: 9781118288238, 978-1118288238. Readers will learn about the use of scanning probe microscopy to support R efforts in the semiconductor, chemical, personal care product, biomaterial, pharmaceutical, and food science industries, among others.
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About this product
Product Identifiers
PublisherWiley & Sons, Incorporated, John
ISBN-101118288238
ISBN-139781118288238
eBay Product ID (ePID)176525012
Product Key Features
Number of Pages368 Pages
Publication NameScanning Probe Microscopy in Industrial Applications : Nanomechanical Characterization
LanguageEnglish
Publication Year2013
SubjectElectron Microscopes & Microscopy, Nanotechnology & Mems, Microscopes & Microscopy
TypeTextbook
AuthorDalia G. Yablon
Subject AreaTechnology & Engineering, Science
FormatHardcover
Dimensions
Item Height0.9 in
Item Weight23.6 oz.
Item Length9.5 in
Item Width6.4 in
Additional Product Features
Intended AudienceScholarly & Professional
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