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Reliability, Yield, and Stress Burn-In : A Unified Approach for Microelectronics Systems Manufacturing and Software Development by Taeho Taeho Kim, Wei-Ting Kary Wei-Ting Kary Chien and Way Way Kuo (2014, Trade Paperback)

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ISBN-13: 9781461375968, 978-1461375968. The international market is very competitive for high-tech manufacturers to?. Achieving competitive quality and reliability for products requires leader?. As a result, an important agenda is the study of reliability issues in fabricating microelectronic products and consequently the systems that employ these products, particularly, the new generation of microelectronics.

About this product

Product Identifiers

PublisherSpringer

ISBN-101461375967

ISBN-139781461375968

eBay Product ID (ePID)209410315

Product Key Features

Number of PagesXxvi, 394 Pages

Publication NameReliability, Yield, and Stress Burn-In : A Unified Approach for Microelectronics Systems Manufacturing and Software Development

LanguageEnglish

Publication Year2014

SubjectSoftware Development & Engineering / General, Electronics / Semiconductors, Electronics / Circuits / Integrated, Electronics / Microelectronics, Manufacturing, Electrical, Materials Science / Electronic Materials

TypeTextbook

AuthorTaeho Taeho Kim, Wei-Ting Kary Wei-Ting Kary Chien, Way Way Kuo

Subject AreaComputers, Technology & Engineering

FormatTrade Paperback