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Semiconductor Material and Device Characterization by Dieter K. Schroder (1990, Hardcover)

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About this product

Product Identifiers

PublisherWiley & Sons, Incorporated, John

ISBN-100471511048

ISBN-139780471511045

eBay Product ID (ePID)2130993

Product Key Features

Number of Pages624 Pages

LanguageEnglish

Publication NameSemiconductor Material and Device Characterization

SubjectElectronics / Semiconductors

Publication Year1990

TypeTextbook

AuthorDieter K. Schroder

Subject AreaTechnology & Engineering

FormatHardcover

Dimensions

Item Height1.2 in

Item Weight34 Oz

Item Length9.6 in

Item Width6.4 in

Additional Product Features

Intended AudienceScholarly & Professional

LCCN89-024881

Dewey Edition22

IllustratedYes

Dewey Decimal621.38152

Table Of ContentResistivity. Carrier and Doping Concentration. Contact Resistance and Schottky Barrier Height. Series Resistance, Channel Length, Threshold Voltage. Mobility. Oxide and Interface Trapped Charge. Deep-Level Impurities. Carrier Lifetime. Optical Characterization. Chemical and Physical Characterization. Appendixes. Index.

SynopsisThe first book devoted to modern techniques of semiconductor characterization, this comprehensive guide to semiconductor measurement methods is detailed enough for a two-term graduate course. Organized for quick access so that it can be used as a handbook of specific characterization techniques. Processes are characterized through the use of test structures and the main techniques used within the semiconductor industry are thoroughly explained. While the majority of the book is devoted to widely used electrical characterization methods, the more specialized optical, chemical and physical methods are also covered. Contains over 1,300 references.

LC Classification NumberQC611.S335 1990