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De Gruyter Stem Ser.: Rietveld Refinement : Practical Powder Diffraction Pattern Analysis Using TOPAS by Andreas Leineweber, Robert E. Dinnebier and John S. O. Evans (2018, Trade Paperback)

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About this product

Product Identifiers

PublisherDE Gruyter Gmbh, Walter

ISBN-103110456214

ISBN-139783110456219

eBay Product ID (ePID)240176331

Product Key Features

Number of Pages347 Pages

LanguageEnglish

Publication NameRietveld Refinement : Practical Powder Diffraction Pattern Analysis Using Topas

Publication Year2018

SubjectPhysics / Condensed Matter, Physics / Crystallography, Radiation, Earth Sciences / General, Physics / General

TypeTextbook

AuthorAndreas Leineweber, Robert E. Dinnebier, John S. O. Evans

Subject AreaScience

SeriesDe Gruyter Stem Ser.

FormatTrade Paperback

Dimensions

Item Weight23.1 Oz

Item Length9.4 in

Item Width6.7 in

Additional Product Features

Intended AudienceScholarly & Professional

LCCN2018-954391

Reviews"Dinnebier, Leineweber and Evans have done an outstanding job of explaining the fundamentals of the method and summarizing the exciting new developments. With this book, the reader can find answers to two questions: what information is stored in a powder diffraction pattern, and how to extract that information using TOPAS. I particularly like this combination of theory and practice and I wholeheartedly recommend this excellent read to any user of the powder diffraction method." Tomce Runcevski in: Journal of Applied Crystallography 52 (2019), https://doi.org/10.1107/S1600576719011178

Grade FromCollege Graduate Student

IllustratedYes

Grade ToCollege Graduate Student

Table Of Content- Basics of powder diffraction - The Rietveld formula - Whole Powder Pattern Fitting (Pawley, LeBail, Rietveld) - Concept of Convolution - Deriving the instrumental resolution function - Global versus local optimization - Structure determination - Fourier analysis - Isotropic and anisotropic microstructural properties - Rigid bodies, constraints, restraints - Sequential versus parametric Rietveld refinement - Symmetry and rotational modes - Modelling stacking faults - Quantitative phase analysis - Determination of amorphous content - Agreement factors - Macro programming

SynopsisAlmost 50 years have passed since the famous papers of Hugo Rietveld from the late sixties where he describes a method for the refinement of crystal structures from neutron powder diffraction data. Soon after, the potential of the method for laboratory X-ray powder diffraction was discovered. Although the method is now widely accepted, there are still many pitfalls in the theoretical understanding and in practical daily use. This book closes the gap with a theoretical introduction for each chapter followed by a practical approach.The flexible macro type language of the Topas Rietveld software can be considered as the defacto standard., Almost 50 years have passed since the famous papers of Hugo Rietveld from the late sixties where he describes a method for the refinement of crystal structures from neutron powder diffraction data. Soon after, the potential of the method for laboratory X-ray powder diffraction was discovered. Although the method is now widely accepted, there are still many pitfalls in the theoretical understanding and in practical daily use. This book closes the gap with a theoretical introduction for each chapter followed by a practical approach. The flexible macro type language of the Topas Rietveld software can be considered as the defacto standard.

LC Classification NumberQD945.D52 2019