Next Generation Technology-Enhanced Assessment: Global Perspectives on Occupational and Workplace Testing by Dave Bartram, Douglas H. Reynolds, John C. Scott (Paperback, 2020)

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Product Information

The use of technology for workplace and occupational testing blossomed in the early years of this century. This book offers a demonstration that the first generation of these technologies have now been implemented long enough to observe the patterns and issues that emerge when these approaches evolve through technical advancement and successive application. A new set of issues and opportunities has emerged and the next generation of these applications is now coming of age. This book reflects on the last few decades of this evolutionary process from a vantage point of global experience across a wide range of workplace applications, including employment selection, development, and occupational certification. The themes and issues that arise as this broad treatment unfolds provide an essential foundation for students, researchers, and professionals who are involved with the assessment of human capability and potential in organizational and workplace contexts

Product Identifiers

PublisherCambridge University Press
ISBN-139781107561533
eBay Product ID (ePID)24046559142

Product Key Features

Number of Pages421 Pages
Publication NameNext Generation Technology-Enhanced Assessment: Global Perspectives on Occupational and Workplace Testing
LanguageEnglish
SubjectTechnology, Psychology, Computer Science
Publication Year2020
TypeTextbook
Subject AreaExperimental Psychology
AuthorDave Bartram, Douglas H. Reynolds, John C. Scott
SeriesEducational and Psychological Testing in a Global Context
FormatPaperback

Dimensions

Item Height150 mm
Item Weight620 g
Item Width230 mm

Additional Product Features

EditorDouglas H. Reynolds, John C. Scott, Dave Bartram
Country/Region of ManufactureUnited Kingdom

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