Introduction to Scanning Tunneling Microscopy Third Edition by C. Julian Chen (Hardcover, 2021)

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ISBN-13: 9780198856559, 978-0198856559. Introduction to Scanning Tunneling Microscopy Third Edition Author(s): C. Julian Chen. valuable material and hints for the experts". The third edition is a thoroughly updated and improved version of the recognized "Bible" of the field.

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Telescopes explore the universe: planets, stars, galaxies, and nebulas. Scanning tunnelling microscopes (STM) and atomic force microscopes (AFM) explore the microscopic world: atoms, molecules, and wavefunctions inside atoms and molecules. It was often said that STM is to nanotechnology what the telescope was to astronomy. Yet STM is capable of manipulating the objects it observes, to build nanoscale structures that never existed in Nature. No telescope is capable of bringing Mars and Venus together. There is a large variety of STM and AFM instruments. Even a home-built STM can see beautiful images of atoms and molecules on a desktop. Sophisticated instruments in ultra-high vacuum and low temperature can explore the very details of the subatomic world. STM and AFM guide scientists of various disciplines, including physicists, chemists, engineers, and biologists to visualize and utilize the microscopic world around us.

Product Identifiers

PublisherOxford University Press
ISBN-139780198856559
eBay Product ID (ePID)26046612692

Product Key Features

Number of Pages496 Pages
Publication NameIntroduction to Scanning Tunneling Microscopy Third Edition
LanguageEnglish
SubjectRadiology, Science, Physics
Publication Year2021
TypeTextbook
Subject AreaMechanical Engineering, Nanotechnology
AuthorC. Julian Chen
SeriesMonographs on the Physics and Chemistry of Materials
FormatHardcover

Dimensions

Item Height242 mm
Item Weight964 g
Item Width161 mm
Volume69

Additional Product Features

Country/Region of ManufactureUnited Kingdom
Title_AuthorC. Julian Chen

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