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IEEE Press Ser.: Modern Characterization of Electromagnetic Systems and Its Associated Metrology by Heng Chen, Tapan K. Sarkar, Magdalena Salazar-Palma and Ming Da Zhu (2021, Hardcover)
freshlyprintedbooks (2011)
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About this product
Product Identifiers
PublisherWiley & Sons, Incorporated, John
ISBN-101119076463
ISBN-139781119076469
eBay Product ID (ePID)28049039113
Product Key Features
Number of Pages720 Pages
LanguageEnglish
Publication NameModern Characterization of Electromagnetic Systems and Its Associated Metrology
Publication Year2021
SubjectPhysics / Electromagnetism
TypeTextbook
Subject AreaScience
AuthorHeng Chen, Tapan K. Sarkar, Mingda Zhu, Magdalena Salazar-Palma
SeriesIeee Press Ser.
FormatHardcover
Dimensions
Item Height1.2 in
Item Weight33.7 oz.
Item Length9.1 in
Item Width6.3 in
Additional Product Features
Intended AudienceScholarly & Professional
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