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Failure Analysis of Integrated Circuits: Tools and Techniques by Lawrence C. Wagner (Hardcover, 1999)
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Failure Analysis of Integrated Circuits: Tools and Techniques provides a basic understanding of how the most commonly used tools and techniques in silicon-based semiconductors are applied to understanding the root cause of electrical failures in integrated circuits.
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About this product
Product Information
This must have reference work for semiconductor professionals and researchers provides a basic understanding of how the most commonly used tools and techniques in silicon-based semiconductors are applied to understanding the root cause of electrical failures in integrated circuits.Product Identifiers
PublisherChapman AND Hall
ISBN-139780412145612
eBay Product ID (ePID)86633274
Product Key Features
Number of Pages255 Pages
Publication NameFailure Analysis of Integrated Circuits: Tools and Techniques
LanguageEnglish
Publication Year1999
TypeTextbook
Subject AreaMaterial Science, Electrical Engineering
AuthorLawrence C. Wagner
SeriesThe Springer International Series in Engineering and Computer Science
FormatHardcover
Dimensions
Item Height235 mm
Item Weight1250 g
Item Width155 mm
Volume494
Additional Product Features
EditorLawrence C. Wagner
Country/Region of ManufactureUnited Kingdom
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