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Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials: Proceedings of the NATO Advanced Study Institute on Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials, Algarve, Portugal, 1 - 13 October 2002 by Yossi Rosenwaks, Angus Kingon, Paula M. Vilarinho (Paperback, 2005)

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As the characteristic dimensions of electronic devices continue to shrink, the ability to characterize their electronic properties at the nanometer scale has come to be of outstanding importance. In this sense, Scanning Probe Microscopy (SPM) is becoming an indispensable tool, playing a key role in nanoscience and nanotechnology. SPM is opening new opportunities to measure semiconductor electronic properties with unprecedented spatial resolution. SPM is being successfully applied for nanoscale characterization of ferroelectric thin films. In the area of functional molecular materials it is being used as a probe to contact molecular structures in order to characterize their electrical properties, as a manipulator to assemble nanoparticles and nanotubes into simple devices, and as a tool to pattern molecular nanostructures. This book provides in-depth information on new and emerging applications of SPM to the field of materials science, namely in the areas of characterisation, device application and nanofabrication of functional materials. Starting with the general properties of functional materials the authors present an updated overview of the fundamentals of Scanning Probe Techniques and the application of SPM techniques to the characterization of specified functional materials such as piezoelectric and ferroelectric and to the fabrication of some nano electronic devices. Its uniqueness is in the combination of the fundamental nanoscale research with the progress in fabrication of realistic nanodevices. By bringing together the contribution of leading researchers from the materials science and SPM communities, relevant information is conveyed that allows researchers to learn more about the actual developments in SPM applied to functional materials. This book will contribute to the continuous education and development in the field of nanotechnology.

Product Identifiers

Publisher
Springer-Verlag New York Inc.
ISBN-13
9781402030185
eBay Product ID (ePID)
87553902

Product Key Features

Subject Area
Material Science, Mechanical Engineering, Nanotechnology
Author
Yossi Rosenwaks, Angus Kingon, Paula M. Vilarinho
Publication Name
Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials: Proceedings of the NATO Advanced Study Institute on Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials, Algarve, Portugal, 1 - 13 October 2002
Format
Paperback
Language
English
Subject
Chemistry, Physics
Publication Year
2005
Type
Textbook
Number of Pages
488 Pages

Dimensions

Item Height
235mm
Item Width
155mm
Volume
186
Item Weight
791g

Additional Product Features

Series Title
Nato Science Series Ii: Mathematics, Physics and Chemistry
Country/Region of Manufacture
United States
Editor
Angus Kingon, Paula M. Vilarinho, Yossi Rosenwaks

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About this product

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Best-selling in Adult Learning & University

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Secrets Of Mental Math: The Mathemagician's Guide to Lightening Calculation and Amazing Maths Tricks by Arthur Benjamin, Michael Shermer (Paperback, 2006)

Die with Zero: Getting All You Can from Your Money and Your Life by Bill Perkins (Paperback, 2021)

Happy Odyssey by Adrian Carton de Wiart (Paperback, 2007)

Planet Ponzi by Mitch Feierstein (Paperback, 2012)

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Becoming Bulletproof: Life Lessons from a Secret Service Agent by Evy Poumpouras (Paperback, 2020)

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