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Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials: Proceedings of the NATO Advanced Study Institute on Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials, Algarve, Portugal, 1 - 13 October 2002 by Yossi Rosenwaks, Angus Kingon, Paula M. Vilarinho (Paperback, 2005)

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In this sense, Scanning Probe Microscopy (SPM) is becoming an indispensable tool, playing a key role in nanoscience and nanotechnology. SPM is being successfully applied for nanoscale characterization of ferroelectric thin films.