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Focused Ion Beam Systems : Basics and Applications by Nan Yao (2007, Hardcover)
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The focused ion beam (FIB) system is an important tool for understanding and manipulating the structure of materials at the nanoscale. Combining this system with an electron beam creates a DualBeam - a single system that can function as an imaging, analytical and sample modification tool.
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About this product
Product Identifiers
PublisherCambridge University Press
ISBN-100521831997
ISBN-139780521831994
eBay Product ID (ePID)89534442
Product Key Features
Number of Pages408 Pages
Publication NameFocused Ion Beam Systems : Basics and Applications
LanguageEnglish
SubjectMaterials Science / General, Physics / Electricity, Physics / Nuclear
Publication Year2007
TypeTextbook
AuthorNan Yao
Subject AreaTechnology & Engineering, Science
FormatHardcover
Dimensions
Item Height0.9 in
Item Weight30 oz.
Item Length9.6 in
Item Width6.7 in
Additional Product Features
Intended AudienceScholarly & Professional
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