Introduction to Scanning Tunneling Microscopy by C. Julian Chen (Hardcover, 1993)

baham_books (2671445)
99.5% positive Feedback
Price:
£200.64
Free postage
Estimated delivery Sat, 19 Jul - Sat, 26 Jul
Returns:
30 days return. Buyer pays for return postage. If you use an eBay delivery label, it will be deducted from your refund amount.
Condition:
New
Title: Introduction to Scanning Tunneling Microscopy (Oxford Series in Item Condition: New. Author: C. Julian Chen ISBN 10: 0195071506. Used-like N : The book pretty much look like a new book. There will be no stains or markings on the book, the cover is clean and crisp, the book will look unread, the only marks there may be are slight bumping marks to the edges of the book where it may have been on a shelf previously. ).

About this product

Product Information

Due to its nondestructive imaging power, scanning tunneling microscopy has found major applications in the fields of physics, chemistry, engineering, and materials science. This book provides a comprehensive treatment of scanning tunneling and atomic force microscopy, with full coverage of the imaging mechanism, instrumentation, and sample applications. The work is the first single-author reference on STM and presents much valuable information previously available only as proceedings or collections of review articles. It contains a 32-page section of remarkable STM images, and is organized as a self-contained work, with all mathematical derivations fully detailed. As a source of background material and current data, the book will be an invaluable resource for all scientists, engineers, and technicians using the imaging abilities of STM and AFM. It may also be used as a textbook in senior-year and graduate level STM courses, and as a supplementary text in surface science, solid-state physics, materials science, microscopy, and quantum mechanics.

Product Identifiers

PublisherOxford University Press
ISBN-139780195071504
eBay Product ID (ePID)89569542

Product Key Features

SubjectScience
Publication Year1993
Number of Pages434 Pages
Publication NameIntroduction to Scanning Tunneling Microscopy
LanguageEnglish
TypeTextbook
AuthorC. Julian Chen
FormatHardcover

Dimensions

Item Weight1090 g

Additional Product Features

Country/Region of ManufactureUnited States
Title_AuthorC. Julian Chen

All listings for this product

Buy it now
New
No ratings or reviews yet
Be the first to write a review