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Advanced Tomographic Methods in Materials Research and Engineering by John Banhart (Hardcover, 2008)

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ISBN-13: 9780199213245, 978-0199213245. This book is mainly written for applied physicists, materials scientists and engineers. The book is grouped into four parts: a general introduction into the principles of tomography, image analysis and the interactions between radiation and matter, and one part each for synchrotron X-ray tomography, neutron tomography, and electron tomography.

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Tomography provides three-dimensional images of materials or engineering components and an unprecedented insight into their internal structure. This book, written for applied physicists, materials scientists and engineers, discusses recent developments in the field, such as the extension of tomographic methods to materials research and engineering.