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Scanning Microscopy for Nanotechnology: Techniques and Applications by Weilie Zhou, Zhong Lin Wang (Paperback, 2010)
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ISBN-13: 9781441922090, 978-1441922090. Scanning Microscopy for Nanotechnology. Techniques and Applications. Publisher: Springer-Verlag New York Inc., United States.
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Product Information
This book presents scanning electron microscopy (SEM) fundamentals and applications for nanotechnology. It includes integrated fabrication techniques using the SEM, such as e-beam and FIB, and it covers in-situ nanomanipulation of materials. The book is written by international experts from the top nano-research groups that specialize in nanomaterials characterization. The book will appeal to nanomaterials researchers, and to SEM development specialists.Product Identifiers
PublisherSpringer-Verlag New York Inc.
ISBN-139781441922090
eBay Product ID (ePID)97626397
Product Key Features
Number of Pages522 Pages
Publication NameScanning Microscopy for Nanotechnology: Techniques and Applications
LanguageEnglish
SubjectEngineering & Technology, Science
Publication Year2010
TypeTextbook
Subject AreaMaterial Science, Nanotechnology
AuthorWeilie Zhou, Zhong Lin Wang
FormatPaperback
Dimensions
Item Height235 mm
Item Weight813 g
Item Width155 mm
Additional Product Features
EditorZhong Lin Wang, Weilie Zhou
Country/Region of ManufactureUnited States
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